Height gauge



Allg 21, 1951 B. B. LEqs-rle 2,565,140

HEIGHT GAUGE Filed Feb. l5. 1946 INVENToR. BEA/N0 B. 505776 y BY YM l AOE'NEYS Patented Aug. 21, 1951 UNITED STATES PATENT OFFICE HEIGHT GAUGEBennoB. Leustig, Cleveland, Ohio.

Application February 15, 1946; Serial'No. 647,802

(Cl. .t3-470) i 11 Claims.

. 1` This invention relates broadly togaging instruments and morespecically to an improved bench micrometer yadapted for use either as acaliper or a height gage.

One` ofthe objects of the invention isV provide a'micrometer ycaliperhaving a limit gage mounted in the work engaging member thereof, theinstrument being designed for use as a snap gage in which the gagingmember may be adjusted to the go orv high limit of Ythe specifiedtolerance of the work and the limit gage or secondary micrometer gagingmember may be adjusted to the no go or lowlimit-tolerance.

Another objectof the invention is to provide a micrometer caliper in`which the gaging anvil may inverted to accommodate the use'of theinstrument-as a height gage.

Another 'object of the invention is to provide af micrometer caliperhaving a work st-op plate mountedtherein which isadapted for adjustmentWithin the range of tolerances customarily speciedas the decimal 'limits`to which work pieces are to be machined.

.Another object of the invention is to provide a gage which is economicof manufacture, eiiicient of lvoperation and A'susceptible ofvmanipulation with greater' ease than micrometer calipers of theportable type.

Other objects and advantages more or 'less ancillary to the foregoingand the manner in which allthe various vobjects are realizedwill'appear` in the following description, which considered inconnection with'the accompanying drawings, sets fortlithe preferredembodiment of 'the invention.

Referring tothe drawings:

Fig; l isa vertical sectional view of the improved'gage;

Fig. 2"is a similar vertical section illustrating the-instrumentadjusted for use as -a height gage showing the scale on the oppositeside of the micrometer screw;

Fi"g.`3 is an enlarged detailed-view of a fragmentary portion of thescrew and gaging anvils; and

4 is a transverse section through theinstrument, a sec-tion being taken'oni-av plane'indicated bythe line 4-lI`in Fig. 1.

Referring'first to Fig. 1, the gage comprises afbafsev plate Ill'boredfor the reception of a post II` which is formed with la' screw threadofthe pitchcustomarily used in micrometer calipers. The post is preferablyformed with areduced end portion' yI2 which is pressed or otherwiserigidly secured Vin. anlopening' in the center'portion of the" base. I0.The post is further machinedv with longitudinal at' areas 1I3 disposedin opposed relation with eachother. The flat areas I3 are provided. withgraduations similar to those empl'oyed on the barrel of a micrometercaliper, the graduations or scaleon one side of the post being spacedfrom the base of the gage a distance equal to the'height of the gagingYplate so that direct readings 1 may bei takenwhen the plate isinverted.. The post' II isprovided with an annular plate I4 constitutingthe gaging anvil of the caliper. The plate is bored and threaded forengagement on the post and is further formed with a'boss I Shaving abeveled end portion I6 thereon which is graduated with radial linessimilar to thoseon the "sleeve of al micrometer caliper. The boss I5isdrilled and tapped for the reception of a'- set screw I1 for lockingtheplate in fixedrelation with the post after the plate is adjusted to itsgag-ing position.r To avoid mutilation of the thread-ed post, acopper'plug I8 may be interposedV between the end of the set screw andthe micrometer thread;

The boss `I5-is mach-ined for the support of a spheroidal lens `I 9which'is'f-ormed with a conical boreA through the axis thereof. Thetransverse axis of the lens is disposed relativethe graduationsi on thepost and beveled. face of the boss to effect the magnification thereof.

The face of the'vplatelll` opposite the boss I5 is boredyfor"the-receptionof a ring 20 having a drilled and tapped openingltherein for engagement'with a' micrometric-thread 2! found in a hub ofthe plate I4. The 'ring is formed with a, depending boss 22 which isknurled. to accommodate adjustment'thereof. The plate I4 is drilled Iandtapped for the reception of a set screw 23 adapted to lock the ring infixed relation with the plate after proper adjustment thereof has beenmade. A copper plug 24'is interposed between the screw and ringf20'to'prevent mutilation of the outer face thereof. The plate I4' is`formed with a witness mark 2li which registers with asimilar mark 26 onthe ring 20fwhen the gaging face D 'of the ring is" flush with thesurface Bof the plate I4; The ringv is further provided with graduations21 calibrated relative tothe thread 2l rin the ring 2li to read' inthousandths of anv inch. By'way of illustration, if the work piece isspecified as S500i-.003 the ring may-be adjusted to protrude .006 of aninchbeyond the surface'B of the plate I4 in order to` obtain the"no goreading of the limit gage. The'plate may then be set to read 3.503 orthe go limit of the specified tolerance for thejwork piece.`

Whenthe gage isV assembled as illustrated' in Fig. 1 the plate I4 may beadjusted to the high limit of the dimension specified for the finishedwork piece and the ring 2|] -adjusted to the low limit of the specifiedtolerance. With the gage thus adjusted, the work piece may be insertedbetween the ground face A of the base plate IIJ and the finished surfaceB -of the plate 14. The Work may then 'be moved inwardly towards thedepending shoulder C defined by the edge of the ring 2D. If the work iswithin the specified tolerances, shoulder C will arrest further movementthereof and indicate that the Work has been machined Within the speciedtolerances.

When the instrument is used as a height gage,

- the plate I4 may be inverted as illustrated in` Fig. 2 and readingsmay be taken from the surface plate upon which the instrument is mountedto the surface B of the gage or to the no go surface D of the ring. Whenthe gage is used either as a snap or height gage, the set screws Il and23 may be locked to maintain the proper adjustment of the respectiveparts of the gage.

Although the foregoing description is necessarily of a detailedcharacter, in order that the invention may be completely set forth, itis to be understood that the specific terminology is not intended to berestrictive or confining, and that various rearrangements of parts andmodifications of detail may be resorted to without departing from thescope or spirit of the invention as herein claimed.

What I claim is 1. A gage comprising a base, a micrometer screw thereon,graduations on said screw, a plate lthreaded on said screw, radialgraduations thereon, a transparent sphere having a hole therethroughmounted on said plate, said Screw being .disposed Iwithin said hole, theradial graduations on said plate being disposed in a plane common to thetransverse axis of said sphere.

2. A bench gage comprising a base, a micrometer screw thereon normalthereto, a plate threaded thereon constituting a gaging anvil,graduations on said plate, two scales on said screw, one of said scalesindicating the height of the upper face of said plate above the lowerface of the base, the other of said scales indicating the distance ofthe lower face of said plate from the upper face of the base, and aspheroidal lens having a hole therethrough to receive said screw mountedon said plate for magnifying the graduations on said plate and thescales on the screw.

3. A bench micrometer gage comprising a base constituting one of thegaging elements, a micrometer screw mounted on said base normal thereto,a plate constituting a second gaging element mounted on said screw,graduations on said screw, radial graduations on said plate and anaxially bored transparent sphere on said plate circumambient said screwconstituting a lens for magnifying said graduations.

4. A bench gage comprising a base formed with a first gaging surface, acolumn mounted on the base normal to the gaging surface and formed witha screw thread, a member movable on the column and engaging the thread,a second gaging surface on said member parallel to the first gagingsurface, and a body threaded on the member for movement relative theretonormal to the gaging surfaces, the body being formed with a third gagingsurface parallel to the other gaging surfaces movable from a planecoinciding with the second gaging surface.

5. A bench gage comprising a base formed with a rst gaging surface, acolumn mounted on the base normal to the gaging surface and formed witha screw thread, a member movable on the column and engaging the thread,a second gaging surface on said member parallel to the first gagingsurface, and a body threaded on the member for movement relative theretonormal to the gaging surfaces, the body being rotatable relative to thecolumn and being formed with a third gaging surface parallel to theother gaging surfaces movable from a plane coinciding with the secondgaging surface.

6. A bench gage comprising a base formed with a rst gaging surface, acolumn mounted on the base normal to the gaging surface and formed witha micrometer thread and a longitudinal index line, a member movable onthe column and engaging the thread, a second gaging surface on saidmember parallel to the first gaging surface and 'with micrometergraduations cooperating with the index line, a body threaded on themember for movement relative thereto normal to the gaging surfaces, thebody being formed with a third gaging surface parallel to the othergaging surfaces movable from a plane coinciding with the second gagingsurface, and micrometer gradnations to indicate the relativedisplacement of the second and third gaging surfaces.

7. A bench gage .comprising a base formed with a first gaging surface, acolumn mounted on the base normal to the gaging surface and formed witha micrometer thread and a longitudinal index line, a member movable onthe column and engaging the thread, a second gaging surface on saidmember parallel to the first gaging surface and with mircrometergraduations cooperating with the index line, a body threaded on themember for movement relative thereto normal to the gaging surfaces, thebody being rotatable relative to the column and being formed with athird gaging surface parallel to the other gaging surfaces movable froma plane coinciding with the second gaging surface, and micrometergraduations to indicate the relative displacement of the second andthird gaging surfaces.

8. A bench gage comprising a base formed with a first gaging surface, acolumn mounted on the base, a member adjustable on the column,Y -asecond gaging surface on said member parallel to the first gagingsurface, a body threaded on on the member for movement relative theretonormal to the gaging surfaces, the body being formed with a third gagingsurface parallel to the other gaging surfaces movable relative to thesecond gaging surface independently of the movement of the second gagingsurface relative to the first gaging surface, and micrometer graduationsto indicate the relative displacement of the second and third gagingsurfaces.

9. A bench gage comprising a screw, a first member fixed on the screw, asecond member threaded on and rotatable on the screw for adjustmentlongitudinally thereof relative to the first member, a hub on the secondmember threaded on an axis parallel to the axis of the screw, and athird member threaded on and rotatable on the threaded hub foradjustment longitudinally of the screw relative to the other members,the third and first members being relatively rotatable, each memberbeing formed with a gage surface normal to the axis of the screw, andmicrometer graduations to indicate the distances between the gagesurfaces.

10. A bench gage comprising a screw, a first member xed on the screw, asecond member threaded on and rotatable on the screw for adjustmentlongitudinally thereof relative to the first member, a hub on the secondmember threaded on an axis parallel to the axis of the screw, and athird member threaded on and rotatable on the threaded hub foradjustment longitudinally of the screw relative to the other members,the third and rst members being relatively rotatable, each member beingformed with a gage surface normal to the axis of the screw, andmicrometer graduations to indicate the distances between the gagesurfaces, the gage surfaces of the second and third members facing inthe same direction and being adjustable into the same plane.

11. A bench gage comprising a screw, a first member xed on the screw, asecond member threaded on and rotatable on the screw for acljustmentlongitudinally thereof relative to the rst member, a hub on the secondmember threaded on an axis parallel to the axis of the screw, and athird member threaded on and rotatable on the threaded hub foradjustment longitudinally of the screw relative to the other members,the third and first members being relatively rotatable, each memberbeing formed with an annular gage surface normal to the axis of thescrew, and micrometer graduations to indicate the distances between thegage surfaces, one of the said second and third members being receivedin a recess of the other of the second and third members so that thegage surfaces of the second and third members may be moved into a commonplane.

BENNO B. LEUSTIG.

REFERENCES CITED The following references are of record in the file ofthis patent:

UNITED STATES PATENTS Number Name Date 1,149,383 Meilicke Aug. 10, 19152,011,945 Mathi Aug. 20, 1935 2,350,881 Dickerman June 6, 1944 2,385,874Metro Oct. 2, 1945 2,388,252 Crane Nov. 6, 1945 2,399,160 Betoche Apr.30, 1946 OTHER REFERENCES Publication, American Machinist, Page 125,January 3, 1946.

